IJPAM: Volume 20, No. 4 (2005)

A GENERIC PROCEDURE FOR EXACT HIGH
FREQUENCY DEVICE CHARACTERIZATION
USING POST-PROCESSING DATA

D. McPhee$^1$, M.C.E. Yagoub$^2$
$^{1,2}$School of Information, Technology and Engineering (SITE)
University of Ottawa
800 King Edwards Ave., Ottawa, Ontario, K1N 6N5, CANADA
$^1$e-mail: [email protected]
$^2$e-mail: [email protected]


Abstract.In this paper, a robust mathematical method is presented to efficiently extract the characteristic parameters of a given high frequency device from a set of simulated or measured data of a larger structure. The proposed post-processing data approach is based on the exact resolution of a system of nonlinear equations which describes the entire structure. The related equations were derived from the widely used connection scattering matrix representation and solved using advanced numerical and symbolic computational tools. In terms of de-embedding, this method was used to obtain the device characteristic matrix from measurement data while removing parasitic effects of the whole equipment bench. It helped also to get the device characteristic matrix through a port reduction technique. This method was also applied to accurately compute the effects of electromagnetic coupling in an integrated circuit in two and three port structures.

Received: April 28, 2005

AMS Subject Classification: 93B51

Key Words and Phrases: de-embedding methods, distributed coupling, modeling, optimization, port-reduction methods, post-processing data, symbolic language

Source: International Journal of Pure and Applied Mathematics
ISSN: 1311-8080
Year: 2005
Volume: 20
Issue: 4