IJPAM: Volume 80, No. 2 (2012)


P. Guayjarernpanishk$^1$, T. Mayureesawan$^2$
$^{1,2}$Department of Applied Statistics
Faculty of Applied Science
King Mongkut's University of Technology
North Bangkok, Bangkok, 10800, THAILAND

Abstract. This paper presents the MCSP-2-C for the concept of a two-level continuous sampling plan that has been developed from the single-level continuous sampling plan MCSP-C. The parameters used in MCSP-2-C are i (the number of consecutive conforming units that must be produced during a 100% inspection), c (the acceptance number), m (the number of conforming units to be found before allowing c non-conforming units in the sampling inspection), $f_{1}$ and $f_{2}$ (the specified sampling frequency at level 1 and 2, respectively). Three performance measure formulas were developed, namely average fraction inspected (AFI), average outgoing quality (AOQ) and average outgoing quality limit (AOQL). The validity of these formulas have been tested by extensive simulations for all sets of parameters and the probability of non-conforming units (p). The AFI and AOQ values from the two plans were compared and it was found that MCSP-2-C does not give an appreciable difference with results at p = 0.005, 0.008, 0.01 and 0.02 when r is large for all sets of i and c. However, it was found that MCSP-2-C gives a lower number of units inspected than MCSP-C when i is large, p = 0.03 and 0.05 for all sets of r and c.

Received: June 29, 2012

AMS Subject Classification: 60J25, 60J27, 60J28

Key Words and Phrases: two-level continuous sampling plan, average fraction inspected, average outgoing quality, average outgoing quality limit

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Source: International Journal of Pure and Applied Mathematics
ISSN printed version: 1311-8080
ISSN on-line version: 1314-3395
Year: 2012
Volume: 80
Issue: 2